Author: Kostlmeier S. Elsasser C. Meyer B.
Publisher: Elsevier
ISSN: 0304-3991
Source: Ultramicroscopy, Vol.80, Iss.2, 1999-10, pp. : 145-151
Disclaimer: Any content in publications that violate the sovereignty, the constitution or regulations of the PRC is not accepted or approved by CNPIEC.
Abstract
Related content
Improved background-fitting algorithms for ionization edges in electron energy-loss spectra
Ultramicroscopy, Vol. 92, Iss. 2, 2002-07 ,pp. :