Solid nitrogen: electron microscopy and beam damage quantification at 4K

Author： Zemlin F.   Beckmann E.   Charle K.-P.   Schatz M.   Schlogl R.  

Publisher： Elsevier

ISSN： 0304-3991

Source： Ultramicroscopy, Vol.80, Iss.3, 1999-11, pp. : 153-161

Disclaimer: Any content in publications that violate the sovereignty, the constitution or regulations of the PRC is not accepted or approved by CNPIEC.

Previous Menu Next

Abstract

Related content

Surface damage formation during ion-beam thinning of samples for transmission electron microscopy

By McCaffrey J.P.   Phaneuf M.W.   Madsen L.D.  

Ultramicroscopy, Vol. 87, Iss. 3, 2001-04 ,pp. : 97-104

Elsevier

Access to resources Recommend Favorite

An approximate multi-beam form of the ''ellipse'' in high-resolution transmission electron microscopy

By Hu J.J.   Tanaka N.  

Ultramicroscopy, Vol. 74, Iss. 3, 1998-08 ,pp. : 105-111

Elsevier

Access to resources Recommend Favorite

Nanofabrication by advanced electron microscopy using intense and focused beamInvited paper.

By  

Science and Technology of Advanced Materials, Vol. 9, Iss. 1, 2008-01 ,pp. : 311-330

IOP Publishing

Access to resources Recommend Favorite

Correlations between ionization radiation damage and charging effects in transmission electron microscopy

By Cazaux J.  

Ultramicroscopy, Vol. 60, Iss. 3, 1995-10 ,pp. : 411-425

Elsevier

Access to resources Recommend Favorite

Optimum condition of convergent beam illumination for observation of local structure by high resolution transmission electron microscopy

By Mitome M.   Takayanagi K.  

Ultramicroscopy, Vol. 62, Iss. 1, 1996-01 ,pp. : 123-131

Elsevier

Access to resources Recommend Favorite