Residual wave aberrations in the first spherical aberration corrected transmission electron microscope

By Uhlemann S.   Haider M.  

Ultramicroscopy, Vol. 72, Iss. 3, 1998-05 ,pp. : 109-119

Elsevier

Access to resources Recommend Favorite

A new method for the determination of the wave aberration function for high resolution TEM - 1. Measurement of the symmetric aberrations

By Meyer R.R.   Kirkland A.I.   Saxton W.O.  

Ultramicroscopy, Vol. 92, Iss. 2, 2002-07 ,pp. : 89-109

Elsevier

Access to resources Recommend Favorite

A new method to perform in situ current voltage curves with an electrochemical scanning tunnelling microscope

By Abadal G.   Perez-Murano F.   Barniol N.   Borrise X.   Aymerich X.  

Ultramicroscopy, Vol. 66, Iss. 3, 1996-12 ,pp. : 133-139

Elsevier

Access to resources Recommend Favorite

Advanced electron holography: a new algorithm for image processing and a standardized quality test for the FEG electron microscope

By Volkl E.   Allard L.F.   Datye A.   Frost B.  

Ultramicroscopy, Vol. 58, Iss. 1, 1995-04 ,pp. : 97-103

Elsevier

Access to resources Recommend Favorite

A new sampling device for measuring solids hold-up in a three-phase system

By Freitas C.   Vicente A.A.   Mota M.   Teixeira J.A.  

Biotechnology Techniques, Vol. 11, Iss. 7, 1997-01 ,pp. : 489-492

Springer Publishing Company

Access to resources Recommend Favorite