Author: Rodenburg J.M.
Publisher: Elsevier
ISSN: 0304-3991
Source: Ultramicroscopy, Vol.87, Iss.3, 2001-04, pp. : 105-121
Disclaimer: Any content in publications that violate the sovereignty, the constitution or regulations of the PRC is not accepted or approved by CNPIEC.
Abstract
Related content
Interpretable resolution of 0.2 nm at 100 kV using electron holography
By Harscher A. Lang G. Lichte H.
Ultramicroscopy, Vol. 58, Iss. 1, 1995-04 ,pp. :
High resolution electron microscopy of crystalline polymer wedges
Ultramicroscopy, Vol. 62, Iss. 4, 1996-03 ,pp. :