Compositional analysis based on electron holography and a chemically sensitive reflection

Author: Rosenauer A.   Van Dyck D.   Arzberger M.   Abstreiter G.  

Publisher: Elsevier

ISSN: 0304-3991

Source: Ultramicroscopy, Vol.88, Iss.1, 2001-06, pp. : 51-61

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Abstract