Author： Vurpillot F. Bostel A. Blavette D.
Publisher： Elsevier
ISSN： 0304-3991
Source： Ultramicroscopy, Vol.89, Iss.1, 2001-10, pp. : 137-144
Disclaimer: Any content in publications that violate the sovereignty, the constitution or regulations of the PRC is not accepted or approved by CNPIEC.
Abstract
Related content
Remote atom probe field ion microscopy
Ultramicroscopy, Vol. 79, Iss. 1, 1999-09 ,pp. :
Access to resources
Recommend
Dynamics of surface reactions studied by field emission microscopy and atom-probe mass spectrometry
By Kruse N.
Ultramicroscopy, Vol. 89, Iss. 1, 2001-10 ,pp. :
Three-dimensional atomic scale microscopy with the atom probe
By Menand A. Cadel E. Pareige C. Blavette D.
Ultramicroscopy, Vol. 78, Iss. 1, 1999-06 ,pp. :
A new approach to gas field ion sources
By Salancon E. Hammadi Z. Morin R.
Ultramicroscopy, Vol. 95, Iss. unknown, 2003-05 ,pp. :