A new approach to the interpretation of atom probe field-ion microscopy images

Author: Vurpillot F.   Bostel A.   Blavette D.  

Publisher: Elsevier

ISSN: 0304-3991

Source: Ultramicroscopy, Vol.89, Iss.1, 2001-10, pp. : 137-144

Disclaimer: Any content in publications that violate the sovereignty, the constitution or regulations of the PRC is not accepted or approved by CNPIEC.

Previous Menu Next

Abstract