Improvement of the mass resolution of the atom probe using a dual counter-electrode

By Deconihout B.   Saint-Martin R.   Jarnot C.   Bostel A.  

Ultramicroscopy, Vol. 95, Iss. unknown, 2003-05 ,pp. : 239-249

Elsevier

Access to resources Recommend Favorite

Effects of incidence angles of ions on the mass resolution of an energy compensated 3D atom probe

By Bemont E.   Bostel A.   Bouet M.   Da Costa G.   Chambreland S.   Deconihout B.   Hono K.  

Ultramicroscopy, Vol. 95, Iss. unknown, 2003-05 ,pp. : 231-238

Elsevier

Access to resources Recommend Favorite

Magnification and mass resolution in local-electrode atom probes

By Bajikar S.S.   Larson D.J.   Kelly T.F.   Camus P.P.  

Ultramicroscopy, Vol. 65, Iss. 1, 1996-09 ,pp. : 119-129

Elsevier

Access to resources Recommend Favorite

Dynamics of surface reactions studied by field emission microscopy and atom-probe mass spectrometry

By Kruse N.  

Ultramicroscopy, Vol. 89, Iss. 1, 2001-10 ,pp. : 51-61

Elsevier

Access to resources Recommend Favorite

Reflection scanning near-field optical microscopy (R-SNOM) in constant height mode with a dielectric probe Image interpretation and resolution for high topographic variations

By Barchiesi D.   Bergossi O.   Pieralli C.   Spajer M.  

Ultramicroscopy, Vol. 71, Iss. 1, 1998-03 ,pp. : 361-370

Elsevier

Access to resources Recommend Favorite