LACBED measurement of the chemical composition of a thin In x Ga 1-x As layer buried in a GaAs matrix

Author： Jacob D.   Androussi Y.   Lefebvre A.  

Publisher： Elsevier

ISSN： 0304-3991

Source： Ultramicroscopy, Vol.89, Iss.4, 2001-11, pp. : 299-303

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