Image reconstruction from electron and X-ray diffraction patterns using iterative algorithms: experiment and simulation

Author： Weierstall U.   Chen Q.   Spence J.C.H.   Howells M.R.   Isaacson M.   Panepucci R.R.  

Publisher： Elsevier

ISSN： 0304-3991

Source： Ultramicroscopy, Vol.90, Iss.2, 2002-02, pp. : 171-195

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