Author： Mobus G. Doole R.C. Inkson B.J.
Publisher： Elsevier
ISSN： 0304-3991
Source： Ultramicroscopy, Vol.96, Iss.3, 2003-09, pp. : 433-451
Disclaimer: Any content in publications that violate the sovereignty, the constitution or regulations of the PRC is not accepted or approved by CNPIEC.
Abstract
Related content
Double-tilt electron tomography
By Penczek P. Marko M. Buttle K. Frank J.
Ultramicroscopy, Vol. 60, Iss. 3, 1995-10 ,pp. :
Access to resources
Recommend
Diffraction effects in electron spectroscopic imaging
By Schenner M. Nelhiebel M. Schattschneider P.
Ultramicroscopy, Vol. 65, Iss. 1, 1996-09 ,pp. :
A marker-free alignment method for electron tomography
By Yu L. Penczek P.A. McEwen B.F. Frank J.
Ultramicroscopy, Vol. 58, Iss. 3, 1995-06 ,pp. :
Imaging of nanometer-sized precipitates in solids by electron spectroscopic imaging
By Hofer F. Warbichler P. Grogger W.
Ultramicroscopy, Vol. 59, Iss. 1, 1995-07 ,pp. :