Characterization of Au/Pb(Zr 0.96 Ti 0.04 )O 3 /Al 2 O 3 /Si antiferroelectric field-effect transistors for memory application

Author： Weng Xu-Dong

Publisher： Springer Publishing Company

ISSN： 1385-3449

Source： Journal of Electroceramics, Vol.25, Iss.2-4, 2010-10, pp. : 174-178

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