Author: Knight Ryan
Publisher: Springer Publishing Company
ISSN: 1385-3449
Source: Journal of Electroceramics, Vol.26, Iss.1-4, 2011-06, pp. : 14-22
Disclaimer: Any content in publications that violate the sovereignty, the constitution or regulations of the PRC is not accepted or approved by CNPIEC.
Abstract
Related content
Piezoelectric PZT films for MEMS and their characterization by interferometry
By Huang Z. Zhang Q. Corkovic S. Dorey R. Duval F. Leighton G. Wright R. Kirby P. Whatmore R.
Journal of Electroceramics, Vol. 17, Iss. 2-4, 2006-12 ,pp. :