Grain Boundary Carrier Scattering in ZnO Thin Films: a Study by Temperature-Dependent Charge Carrier Transport Measurements

Author: Muniswami Naidu R.V.  

Publisher: Springer Publishing Company

ISSN: 1543-186X

Source: Journal of Electronic Materials, Vol.41, Iss.4, 2012-04, pp. : 660-664

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Abstract