Marker-assisted characterization of Asian wheat lines for resistance to Fusarium head blight

Author: Yu Jian-Bin   Bai Gui-Hua   Cai Shi-Bin   Ban Tomohiro  

Publisher: Springer Publishing Company

ISSN: 0040-5752

Source: Theoretical and Applied Genetics, Vol.113, Iss.2, 2006-07, pp. : 308-320

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Abstract