QTL mapping for grain filling rate and yield-related traits in RILs of the Chinese winter wheat population Heshangmai × Yu8679

Author: Wang R.   Hai L.   Zhang X.   You G.   Yan C.   Xiao S.  

Publisher: Springer Publishing Company

ISSN: 0040-5752

Source: Theoretical and Applied Genetics, Vol.118, Iss.2, 2009-01, pp. : 313-325

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