![](/images/ico/ico_close.png)
![](/images/ico/ico5.png)
Author: Bogomol'nyi V.M.
Publisher: Springer Publishing Company
ISSN: 0543-1972
Source: Measurement Techniques, Vol.43, Iss.11, 2000-11, pp. : 973-981
Disclaimer: Any content in publications that violate the sovereignty, the constitution or regulations of the PRC is not accepted or approved by CNPIEC.
Abstract
Related content
![](/images/ico/ico_close.png)
![](/images/ico/ico5.png)
Oscillating Structure Defects in Dielectric Diodes
Measurement Techniques, Vol. 45, Iss. 10, 2002-10 ,pp. :
![](/images/ico/ico_close.png)
![](/images/ico/ico5.png)
By Voropaev V. Ganin S. Kostromin V. Popov M.
Measurement Techniques, Vol. 47, Iss. 9, 2004-09 ,pp. :
![](/images/ico/ico_close.png)
![](/images/ico/ico5.png)
![](/images/ico/ico_close.png)
![](/images/ico/ico5.png)