Accuracy of Measurement of Microrelief Dimensions from a Scanning Electron Microscope Image of a Cleavage

Author: Volk C.P.   Novikov Y.A.   Ozerin Y.V.   Rakov A.V.  

Publisher: Springer Publishing Company

ISSN: 0543-1972

Source: Measurement Techniques, Vol.44, Iss.4, 2001-04, pp. : 365-369

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Abstract