Systematic Errors in Circuit Parameter Measurement for Structurally Redundant Devices

Author: Svistunov B.L.  

Publisher: Springer Publishing Company

ISSN: 0543-1972

Source: Measurement Techniques, Vol.45, Iss.3, 2002-03, pp. : 286-291

Disclaimer: Any content in publications that violate the sovereignty, the constitution or regulations of the PRC is not accepted or approved by CNPIEC.

Previous Menu Next

Abstract