Atomic Force Microscopy as a Universal Means of Measuring Physical Quantities in the Mesoscopic Length Range

Author: Arutyunov P.A.   Tolstikhina A.L.  

Publisher: Springer Publishing Company

ISSN: 0543-1972

Source: Measurement Techniques, Vol.45, Iss.7, 2002-07, pp. : 714-721

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Abstract