Multiple-Response Models for Calculating Electronic Device Parameters

ISSN： 0543-1972

Source： Measurement Techniques, Vol.46, Iss.4, 2003-04, pp. : 391-396

Disclaimer: Any content in publications that violate the sovereignty, the constitution or regulations of the PRC is not accepted or approved by CNPIEC.

Previous Menu Next

Abstract

Related content

A New Approach for Multiple-Response Optimization

By Ch'ng C. K. Quah S. H. Low H. C.

Quality Engineering, Vol. 17, Iss. 4, 2005-10 ,pp. : 621-626

Taylor & Francis Ltd

Access to resources Recommend Favorite

Models of distributions of probability density in calculating measurement uncertainty

By Rubichev N.

Measurement Techniques, Vol. 56, Iss. 7, 2013-10 ,pp. : 758-762

Springer Publishing Company

Access to resources Recommend Favorite

Calculating reliability in diagnosis and monitoring of an engineering system with several monitored parameters

By Skvortsov A. Ukolov M.

Measurement Techniques, Vol. 49, Iss. 6, 2006-06 ,pp. : 540-544

Springer Publishing Company

Access to resources Recommend Favorite

Modeling the optimal parameters for a remote sensing device

By Bushmeleva K.

Measurement Techniques, Vol. 54, Iss. 3, 2011-06 ,pp. : 294-299

Springer Publishing Company

Access to resources Recommend Favorite

A Statistical Physics Method of Electronic Device Reliability Testing from Working Data

By Grodzenskii S. Ya.

Measurement Techniques, Vol. 46, Iss. 6, 2003-06 ,pp. : 616-618

Springer Publishing Company

Access to resources Recommend Favorite