![](/images/ico/ico_close.png)
![](/images/ico/ico5.png)
Author: Krekhov I. V. Krekhov E. V.
Publisher: Springer Publishing Company
ISSN: 0543-1972
Source: Measurement Techniques, Vol.47, Iss.4, 2004-04, pp. : 397-401
Disclaimer: Any content in publications that violate the sovereignty, the constitution or regulations of the PRC is not accepted or approved by CNPIEC.
Abstract
Related content
![](/images/ico/ico_close.png)
![](/images/ico/ico5.png)
![](/images/ico/ico_close.png)
![](/images/ico/ico5.png)
By Krekhov E. V. Krekhov I. V.
Measurement Techniques, Vol. 47, Iss. 1, 2004-01 ,pp. :
![](/images/ico/ico_close.png)
![](/images/ico/ico5.png)
Optimization of micromechanical accelerometer structures
By Papko A.
Measurement Techniques, Vol. 54, Iss. 3, 2011-06 ,pp. :
![](/images/ico/ico_close.png)
![](/images/ico/ico5.png)
Optimization of the Topology of Photoresistors
By Dolganin Yu. N. Savchenko M. A.
Measurement Techniques, Vol. 47, Iss. 1, 2004-01 ,pp. :
![](/images/ico/ico_close.png)
![](/images/ico/ico5.png)
Robustness of Robust Process Optimization
Quality Engineering, Vol. 14, Iss. 1, 2002-01 ,pp. :