Diffraction Laser-Electronic Fourier Thickness Gage for Monitoring the Thickness of a Large Diameter Lens

Author: Korotkevich A.   Nemtinov V.   Subin A.  

Publisher: Springer Publishing Company

ISSN: 0543-1972

Source: Measurement Techniques, Vol.48, Iss.10, 2005-10, pp. : 978-985

Disclaimer: Any content in publications that violate the sovereignty, the constitution or regulations of the PRC is not accepted or approved by CNPIEC.

Previous Menu Next

Abstract

Related content