The Use of Correlation Analysis of the Image in Phase Optoelectronic Devices

Author: Soldatov V.  

Publisher: Springer Publishing Company

ISSN: 0543-1972

Source: Measurement Techniques, Vol.48, Iss.5, 2005-05, pp. : 471-475

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Abstract

The possibility of using phase-correlation analysis of an image in optoelectronic devices to measure small angular and linear displacements of objects is considered. It is shown that the measurement accuracy is thereby increased.