Author: Soldatov V.
Publisher: Springer Publishing Company
ISSN: 0543-1972
Source: Measurement Techniques, Vol.48, Iss.5, 2005-05, pp. : 471-475
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Abstract
The possibility of using phase-correlation analysis of an image in optoelectronic devices to measure small angular and linear displacements of objects is considered. It is shown that the measurement accuracy is thereby increased.
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