Book Review: Spatial Statistics for Remote Sensing. By Alfred Stein, Freek Van Der Meer, and Ben Gorte. Kluwer Academic Publishers, Dordrecht, The Netherlands, 1999, 284 p., $135 (U.S.), ISBN 0-7923-5958-X paperback

Author： Coburn T.C.  

Publisher： Springer Publishing Company

ISSN： 0882-8121

Source： Mathematical Geology, Vol.35, Iss.1, 2003-01, pp. : 105-109

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