Combining GAs and Symbolic Methods for High Quality Tests of Sequential Circuits

ISSN： 0923-8174

Source： Journal of Electronic Testing, Vol.17, Iss.1, 2001-02, pp. : 37-51

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Abstract

A symbolic fault simulator is integrated in a Genetic Algorithm (GA) environment to perform Automatic Test Pattern Generation (ATPG) for synchronous sequential circuits. In a two phase algorithm test length and fault coverage as well are optimized. Furthermore, not only the Single Observation Time Test Strategy is supported, but also test patterns with respect to the Multiple Observation Time Test Strategy are generated. However, there are circuits that are hard to test using random pattern sequences, even if these sequences are genetically optimized. Thus, deterministic aspects are included in the GA environment to improve fault coverage. Experiments demonstrate that both a priori time consuming strategies, the symbolic simulation approach and the GA, can be combined at reasonable costs: Tests with higher fault coverages and considerably shorter test sequences than previously presented approaches are obtained.