Catastrophic Short and Open Fault Detection in Bipolar CML Circuits: A Case Study

By Ivanov A.  

Journal of Electronic Testing, Vol. 16, Iss. 6, 2000-12 ,pp. : 631-634

Springer Publishing Company

Access to resources Recommend Favorite

Proposal of Fault Diagnosis of Analog Circuits by Combining Operation-Region Model and X – Y Zoning Method: Case Study

By Miura Yukiya  

Journal of Electronic Testing, Vol. 22, Iss. 4-6, 2006-12 ,pp. : 411-423

Springer Publishing Company

Access to resources Recommend Favorite

Fault Models and Test Procedures for Flash Memory Disturbances

By Mohammad M.G.  

Journal of Electronic Testing, Vol. 17, Iss. 6, 2001-12 ,pp. : 495-508

Springer Publishing Company

Access to resources Recommend Favorite

Fault Modeling and Fault Simulation in Mixed Micro-Fluidic Microelectronic Systems

By Kerkhoff H.G.  

Journal of Electronic Testing, Vol. 17, Iss. 5, 2001-10 ,pp. : 427-437

Springer Publishing Company

Access to resources Recommend Favorite

Fault Modeling and Simulation Using VHDL-AMS

By Perkins A.J.   Zwolinski M.   Chalk C.D.   Wilkins B.R.  

Analog Integrated Circuits and Signal Processing, Vol. 16, Iss. 2, 1998-06 ,pp. : 141-155

Springer Publishing Company

Access to resources Recommend Favorite