![](/images/ico/ico_close.png)
![](/images/ico/ico5.png)
Publisher: Springer Publishing Company
ISSN: 0923-8174
Source: Journal of Electronic Testing, Vol.22, Iss.2, 2006-04, pp. : 113-114
Disclaimer: Any content in publications that violate the sovereignty, the constitution or regulations of the PRC is not accepted or approved by CNPIEC.
Abstract
Related content
![](/images/ico/ico_close.png)
![](/images/ico/ico5.png)
Test Technology Technical Council Newsletter
By Kim B.
Journal of Electronic Testing, Vol. 21, Iss. 2, 2005-04 ,pp. :
![](/images/ico/ico_close.png)
![](/images/ico/ico5.png)
Test Technology Technical Council Newsletter
By Ivanov A.
Journal of Electronic Testing, Vol. 20, Iss. 1, 2004-02 ,pp. :
![](/images/ico/ico_close.png)
![](/images/ico/ico5.png)
Test Technology Technical Council Newsletter
Journal of Electronic Testing, Vol. 20, Iss. 3, 2004-06 ,pp. :
![](/images/ico/ico_close.png)
![](/images/ico/ico5.png)
Test Technology Technical Council Newsletter
By Ivanov A.
Journal of Electronic Testing, Vol. 18, Iss. 4-5, 2002-08 ,pp. :
![](/images/ico/ico_close.png)
![](/images/ico/ico5.png)
Test Technology Technical Council Newsletter
Journal of Electronic Testing, Vol. 18, Iss. 6, 2002-12 ,pp. :