Depth Profiling (ICP-MS) Study of Trace Metal ‘Grains’ in Solid Asphaltenes

Author: Pillay Avin  

Publisher: Springer Publishing Company

ISSN: 1044-0305

Source: Journal of The American Society for Mass Spectrometry, Vol.22, Iss.8, 2011-08, pp. : 1403-1408

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