Author: van Loosdrecht M.C.M. Heijnen J.J. Eberl H. Kreft J. Picioreanu C.
Publisher: Springer Publishing Company
ISSN: 0003-6072
Source: Antonie van Leeuwenhoek, Vol.81, Iss.1-4, 2002-12, pp. : 245-256
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Abstract
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