In situ semiconductor surface characterisation: a comparative infrared study of Si, Ge and GaAs

Author: Chazalviel J.-N.   Beladi A.   Safi M.   Maroun F.   Erne B.H.   Ozanam F.  

Publisher: Elsevier

ISSN: 0013-4686

Source: Electrochimica Acta, Vol.45, Iss.20, 2000-06, pp. : 3205-3211

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Abstract