XAS, XRD, AFM and Raman studies of nickel tungstate electrochromic thin films

Author： Kuzmin A. Purans J. Kalendarev R. Pailharey D. Mathey Y.

Publisher： Elsevier

ISSN： 0013-4686

Source： Electrochimica Acta, Vol.46, Iss.13, 2001-04, pp. : 2233-2236

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