Microstructure of polycrystalline Ti and its microelectrochemical properties by means of electron-backscattering diffraction (EBSD)

Author： Konig U.   Davepon B.  

Publisher： Elsevier

ISSN： 0013-4686

Source： Electrochimica Acta, Vol.47, Iss.1, 2001-09, pp. : 149-160

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