Scanning photo-induced impedance microscopy-an impedance based imaging technique

Author: Krause S.   Talabani H.   Xu M.   Moritz W.   Griffiths J.  

Publisher: Elsevier

ISSN: 0013-4686

Source: Electrochimica Acta, Vol.47, Iss.13, 2002-05, pp. : 2143-2148

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Abstract