Analysis of the diffusion layer thickness, equivalent circuit and conductance behaviour for reversible electron transfer processes in linear sweep voltammetry

Author： Arun Prasad M.   Sangaranarayanan M.V.  

Publisher： Elsevier

ISSN： 0013-4686

Source： Electrochimica Acta, Vol.49, Iss.3, 2004-01, pp. : 445-453

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