Equilibrium depth and spacing of cracks in a tensile residual stressed thin film deposited on a brittle substrate

Author： Zhang T.-Y.   Zhao M.-H.  

Publisher： Elsevier

ISSN： 0013-7944

Source： Engineering Fracture Mechanics, Vol.69, Iss.5, 2002-03, pp. : 589-596

Disclaimer: Any content in publications that violate the sovereignty, the constitution or regulations of the PRC is not accepted or approved by CNPIEC.

Previous Menu Next

Abstract

Related content

Multiple film cracking in film/substrate systems with residual stresses and unidirectional loading

By Hsueh C.H.   Yanaka M.  

Journal of Materials Science, Vol. 38, Iss. 8, 2003-04 ,pp. : 1809-1817

Springer Publishing Company

Access to resources Recommend Favorite

Oxidation of sputtered Zr thin film on Si substrate

By Kurniawan Tedi   Cheong Kuan   Razak Khairunisak   Lockman Zainovia   Ahmad Nuruddin  

Journal of Materials Science: Materials in Electronics, Vol. 22, Iss. 2, 2011-02 ,pp. : 143-150

Springer Publishing Company

Access to resources Recommend Favorite

Growth of germanium–carbide thin film on crystal substrate

By Tessema Genene   Bekele Mulugeta   Vianden Reiner  

Journal of Materials Science: Materials in Electronics, Vol. 21, Iss. 11, 2010-11 ,pp. : 1144-1148

Springer Publishing Company

Access to resources Recommend Favorite

Chemically deposited zinc oxide thin film gas sensor

By Chatterjee A.P.   Mitra P.   Mukhopadhyay A.K.  

Journal of Materials Science, Vol. 34, Iss. 17, 1999-09 ,pp. : 4225-4231

Springer Publishing Company

Access to resources Recommend Favorite

Influence of Substrate Temperature on the Optoelectronic Properties of CuPc Thin Film

By  

Advanced Materials Research, Vol. 2015, Iss. 1105, 2015-06 ,pp. : 123-126

Trans Tech Publications

Access to resources Recommend Favorite