Resolving orthoclase dissolution processes with atomic force microscopy and X-ray reflectivity

Author: Teng H.H.   Fenter P.   Cheng L.   Sturchio N.C.  

Publisher: Elsevier

ISSN: 0016-7037

Source: Geochimica et Cosmochimica Acta, Vol.65, Iss.20, 2001-10, pp. : 3459-3474

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