An X-Ray Fluorescence Method for Determining the Average Density of Thin Films

Author： Trushin O.S.   Bochkarev V.F.   Goryachev A.A.   Naumov V.V.   Lebedev A.A.  

Publisher： Springer Publishing Company

ISSN： 0019-8447

Source： Industrial Laboratory, Vol.66, Iss.10, 2000-10, pp. : 674-675

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