Analysis of an internal crack of pressure pipeline using ESPI and shearography

Author: Kim K.-S.   Kang K.-S.   Kang Y.-J.   Cheong S.-K.  

Publisher: Elsevier

ISSN: 0030-3992

Source: Optics and Laser Technology, Vol.35, Iss.8, 2003-11, pp. : 639-643

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Abstract