In situ dark field microscopy for on-line monitoring of yeast cultures

Author: Wei Ning   You Jia   Friehs Karl   Flaschel Erwin   Nattkemper Tim  

Publisher: Springer Publishing Company

ISSN: 0141-5492

Source: Biotechnology Letters, Vol.29, Iss.3, 2007-03, pp. : 373-378

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Abstract