Texture analysis with the new HIPPO TOF diffractometer

Author: Wenk H.-R.   Lutterotti L.   Vogel S.  

Publisher: Elsevier

ISSN: 0168-9002

Source: Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment, Vol.515, Iss.3, 2003-12, pp. : 575-588

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Abstract