A statistical correction method for minimization of systemic artefact in a continuous-rotate X-ray based industrial CT system

Author: Kumar U.   Ramakrishna G.S.   Pendharkar A.S.   Kailas S.  

Publisher: Elsevier

ISSN: 0168-9002

Source: Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment, Vol.515, Iss.3, 2003-12, pp. : 829-839

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