Electrical and dielectric properties of low-temperature crystallized Sr 0.8 Bi 2.6 Ta 2 O 9+x thin films on Ir/SiO 2 /Si substrates

Author： Chou H.-Y.   Chen T.-M.   Tseng T.-Y.  

Publisher： Elsevier

ISSN： 0254-0584

Source： Materials Chemistry and Physics, Vol.82, Iss.3, 2003-12, pp. : 826-830

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