Characterization of polyethersulfone-polyimide hollow fiber membranes by atomic force microscopy and contact angle goniometery

Author: Khulbe K.C.   Feng C.   Matsuura T.   Kapantaidakis G.C.   Wessling M.   Koops G.H.  

Publisher: Elsevier

ISSN: 0376-7388

Source: Journal of Membrane Science, Vol.226, Iss.1, 2003-12, pp. : 63-73

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