Author： Shaikh B. Rummel N. Douchi T. Yamamoto S. Nakamura S. Ijuin T. Oki T. Maruta K. Nagata Y. Lee E.S. DiBartolomeo D.L. Selkowitz S.E. Waiyawuth W. Zhang L. Rittner C. Schneider P.M.
Publisher： Elsevier
ISSN： 0379-0738
Source： Forensic Science International, Vol.94, Iss.1, 1998-06, pp. : 25-31
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