The O 2 /H 2 O redox couple as the origin of the structural/electronic defects in polyanilines

Author: Gruger A.   Regis A.   El Khalki A.   Colomban P.  

Publisher: Elsevier

ISSN: 0379-6779

Source: Synthetic Metals, Vol.139, Iss.1, 2003-08, pp. : 175-186

Disclaimer: Any content in publications that violate the sovereignty, the constitution or regulations of the PRC is not accepted or approved by CNPIEC.

Previous Menu Next

Abstract