Visual field defects in acute optic neuritis - distribution of different types of defect pattern, assessed with threshold-related supraliminal perimetry, ensuring high spatial resolution

Author： Nevalainen J.  

Publisher： Springer Publishing Company

ISSN： 0721-832X

Source： Graefe's Archive for Clinical and Experimental Ophthalmology, Vol.246, Iss.4, 2008-04, pp. : 599-607

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