Refractive index properties of SiN thin films and fabrication of SiN optical waveguide

Author: Kim D.   Yoon S.   Jang G.   Suh S.   Kim H.   Yoon D.  

Publisher: Springer Publishing Company

ISSN: 1385-3449

Source: Journal of Electroceramics, Vol.17, Iss.2-4, 2006-12, pp. : 315-318

Disclaimer: Any content in publications that violate the sovereignty, the constitution or regulations of the PRC is not accepted or approved by CNPIEC.

Previous Menu Next

Abstract