Structure and dielectric properties of BaTi 4 O 9 thin films for RF-MIM capacitor applications

Author: Jang Bo-Yun   Kim Beom-Jong   Jeong Young-Hun   Nahm Sahn   Sun Ho-Jung   Lee Hwack-Ju  

Publisher: Springer Publishing Company

ISSN: 1385-3449

Source: Journal of Electroceramics, Vol.17, Iss.2-4, 2006-12, pp. : 387-391

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Abstract