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Oriented growth of Bi 3.25 La 0.75 Ti 3 O 12 thin films on RuO 2 /SiO 2 /Si substrates by using the polymeric precursor method: Structural, microstructural and electrical properties

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The Enhanced Dielectric and Insulating Properties of Al 2 O 3 Modified Ta 2 O 5 Thin Films

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