Author： Iyer S. Li J. Chowdhury-Nagle S. Bajaj K.K.
Publisher： Springer Publishing Company
ISSN： 1543-186X
Source： Journal of Electronic Materials, Vol.26, Iss.4, 1997-04, pp. : 347-349
Disclaimer: Any content in publications that violate the sovereignty, the constitution or regulations of the PRC is not accepted or approved by CNPIEC.
Abstract
Related content
By Ye Hao Li Lu Lotfi Hossein Lei Lin Yang Rui Q Keay Joel C Mishima Tetsuya D Santos Michael B Johnson Matthew B
Semiconductor Science and Technology, Vol. 30, Iss. 10, 2015-10 ,pp. :
Access to resources
Recommend
By Lin Youxi Wang Ding Donetsky Dmitry Kipshidze Gela Shterengas Leon Vorobjev Leonid E Belenky Gregory
Semiconductor Science and Technology, Vol. 29, Iss. 11, 2014-11 ,pp. :
Radiation Damage in Type II Superlattice Infrared Detectors
By Jackson E.M.
Journal of Electronic Materials, Vol. 39, Iss. 7, 2010-07 ,pp. :
Study of Surface Treatments on InAs/GaSb Superlattice LWIR Detectors
By Kutty M.
Journal of Electronic Materials, Vol. 39, Iss. 10, 2010-10 ,pp. :